When it comes to AFM processing, the one name that stands out above all competitors is that of Park Systems. Thus, when we wanted to know more about the complex process of creating images on such a small scale, they are the team to turn to for much deeper insights in this advanced field.

The sophisticated technology that researchers rely on during AFM image processing brings about several advantages. One of the most appreciated benefits is the fast pace at which it can take place for a range of domains and create a wide array of images. The images that they produce is giving them three-dimensional information which is vital in these precise research environments.

They can utilize various instruments and experimental situations to accommodate unusual types of artifacts. These would include unsolicited high or low-frequency noise or influence of unequal backgrounds. At times these artifacts are easily noticed and occasionally they are difficult to detect.

There are a few primary upwellings of artifacts that result in inaccurate AFM feature analysis. AFM images are always affected by the geometrical tip. Therefore, probes can have an impact on the number of artifacts. However, if the probes are small enough, compared to the features, the artifacts will be minimal. The best way to resolve the probe problem is to use the optimal probe for the application.

AFM image processing is a crucial part to process and display data before viewing or investigating an image. The process aims to clarify data obtained during the measurement to ensure AFM features have been recorded with high accuracy.

“The most powerful microscopic technology for studying samples at the nanoscale is without a doubt atomic force microscopy. This is due to the versatility it provides by being able to accommodate various types of surface measurements. It provides in the needs of scientists and engineers through images that present the with three-dimensional topography,” says Kiebock Lee president of Park Systems. He added, “AFM image processing replicates the structure of a sample surface when the cantilever moves over the region of interest while scanning it. The raised and lower features influence the deflection of the cantilever, which is monitored, and by using a feedback loop to control the height of the tip above the surface the device maintains the laser position. This is the process of creating an image. Through this technology of AFM researchers and scientists can generate an accurate topography map of the surface featured.”

About Us

Our team at Park Systems is always working to create change through advances in the field of research and technology by supplying premium quality equipment scientists need for microscopic exploration on a nano level. One of our most advanced features is our commitment to absolute accuracy and precision in all we do and the products we deliver. We aim to deliver the resources you need to have the breakthroughs you work for and to provide the support you need from any of our offices based globally. Have a look at all we have to offer on our website at https://www.parksystems.com or contact us directly and see how we can help you to explore surfaces beyond the conventional barriers of vision.