Scanning Probe Specialist Showcases High-Resolution Automated Tip Scanning Head At The SEMI Technology Unites Global Summit In 2021


Posted May 2, 2021 by parksystems7

Park Systems, A Scanning Probe Specialist, Has Showcased Its High-Resolution Tip Scanning Head At The SEMI Technology Unites Global Summit In 2021.
 
Park Systems is a global leader in the manufacturing of AFM (Atomic Force Microscopy) products. The company launched their new Park NX-TSH, the only automated Tip Scan head for large sample analysis of over 300mm. This was launched at the SEMI Technology Unites Global Summit, which was held from February 15 to 19, 2021.

The Park NX-TSH is designed for large and heavy samples on flat panel display glass 2D encoder sample, featuring conductive AFM for electric defect analysis, which is done by integrating a microprobe station. The Tip Scan Head from Park Systems is an automated moving tip head for industrial AFM measurement on larger samples over 300mm which are developed for the OLED, LCD, Photonics industries for large sample analysis.

The automated Tip Scan Head moves on air bearing stage technology, which combines the x,y,z scanners, which move directly to the desired point on the particular substrate. The global organic LED (OLED) market was valued at $32,463 million in 2019 and is expected to reach over $200 million in the next six years, which is an increase of 21.7% from 2020 to 2027. The major factors which are driving this market are the demand for cost-effective and energy-saving LED lighting, due to increased government initiatives around the world and the demand for large screen backlighting.

The Park NX-TSH was specifically developed for the manufacturing and production of the next generation of flat-panel displays overcoming their 300mm size threshold. Conductive AFM, the Park NX-TSH measures the surface of the sample with an optional probe station, this contacts the sample surface to provide current into smaller chips and devices.

Keibock Lee, the President at Park Systems, said “The automatic tip scanning systems helps to overcome nanometrology challenges with a tip that moves directly into place on the sample to provide high-resolution images of the step height, critical dimension measurements, sidewall measurements and roughness measurements. We have scaled up our AFM tools for the large flat panel displays that are using our new Park NX-TSH system, which is the only automated Tip Scan Head for large sample analysis over 300mm.”

About Us: Park Systems is a leading supplier of AFM systems. This well-established company provides their clients with years of knowledge and experience in the industry. They comprise a dedicated team of experienced professionals who focus on providing the highest level of service and support to their clients daily. Park Systems design their system with care and attention to detail. They are focus driven and have built up a solid reputation on a global scale. The company has a global sales network providing thirty years of experience with over 1,000 AFM’s available. They are the fastest-growing AFM company with more than one hundred and twenty full-time employees. To find out more, visit https://www.parksystems.com.
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Issued By Park Systems
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Business Address 3040 Olcott Street
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Categories Electronics , Science , Technology
Tags afm system , atomic force , ion conductance microscopy
Last Updated May 2, 2021